FB2026_03 , released September 17, 2026

CV Term Report

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General Information

Term

atomic force microscopy

ID (Ontology)

MI:0872 (Molecular Interactions)

Definition

The atomic force microscope (AFM) is a very high-resolution type of scanning probe microscope, with demonstrated resolution of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The AFM was invented by Binnig, Quate and Gerber in 1986, and is one of the foremost tools for imaging, measuring and manipulating matter at the nanoscale.The term 'microscope' in the name is actually a misnomer because it implies looking, while in fact the information is gathered by feeling out the surface with a mechanical feeler.\nhttp://en.wikipedia.org/wiki/Atomic_force_microscope[ PubMed:17502105 ]

Also Known As

"AFM" ; "atomic force microsc"

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Full annotation statements	Interaction Groups
atomic force microscopy (all annotations which use CV term, excluding "NOT" statements)

Spanning Tree (Parents/Children)

  experimental interaction detection
   |__imaging technique
       |__atomic force microscopy  5 rec.

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Relationships
Is a	imaging technique
Part of
Synonyms & Secondary IDs
Synonyms
	"AFM" EXACT PSI-MI-alternate "atomic force microsc" EXACT PSI-MI-short
Secondary IDs

External Crossreferences & Linkouts